Freestanding A-Si Thin Film Transistor for Room-Temperature Infrared Detection

L Dong,RF Yue,LT Liu,WJ Zhang
DOI: https://doi.org/10.1088/0256-307x/21/2/013
2004-01-01
Chinese Physics Letters
Abstract:We present the fabrication and characterization of a novel uncooled infrared sensor for room-temperature infrared imaging. The sensitive element of the sensor is a freestanding amorphous silicon thin film transistor (a-Si TFT) with the temperature coefficient of the drain current (TCC) of 0.015-0.08/K. The TCC value is sensitive to the ambient temperature and can be controlled by the gate voltage of the a-Si TFT. The complete procedures based on the porous silicon micromachining technique for fabricating thermally isolated air bridges are described. The isolation structures have a thermal conductance of 5 x 10(-6) W/K and a thermal capacitance of 4.9 x 10(-8) J/K. The effects of the gate voltage on the performance figures such as responsivity, noise voltage and detectivity are described and analysed in detail. The maximum detectivity reaches 4.33 x 10(8) cmHz(1/2) W-1 at a chopping frequency of 27Hz and a gate voltage of -15 V.
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