Stress induced polarization back-switching in Au(Cr)/PZT/LaNiO 3 ferroelectric capacitor

Xiaoxu Kang,Yinyin Lin,Ting'ao Tang,Xiaoguang Wang,Yu Zhong
2004-01-01
Abstract:The ferroelectric capacitor with the structure of Au(Cr)/PZT/LaNiO 3/SiO 2 was fabricated for the study of polarization switching of PZT/LNO. PZT showed a strong epitaxial tendency on the LaNiO 3 electrode. And it can be observed serious asymmetry in its hysteresis curve. After the capacitor was positive polarized, we can still get small polarization switching current during the following positive-voltage sweeping. Based on the asymmetry of the hysteresis and the depining experiments, this small current can be interpreted by the stress-induced polarization back switching of the non-180°domains.
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