The Effects of Lanthanum′s Doping on PZT Thin Film Leakage Current Characteristics

程继,林殷茵,汤庭鳌
DOI: https://doi.org/10.3321/j.issn:1001-9731.2004.06.009
2004-01-01
Abstract:In this paper we study the Lanthanum doping effects on ferroelectric properties and structures phase of PZT thin film. XRD indicates that Lanthanum addition increases (110) and (200) diffraction intensity and decreases the relative intensity of (111) diffraction peak which leads the reduction of coercive field and polarization strength of PZT thin film. The effects of Lanthanum doping on leakage current characteristics were also studied by Shottky model.
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