Dose Effect in Low and Medium Energy Ion Implantation and Simulation Method

施小康,于民,石浩,黄如,张兴
DOI: https://doi.org/10.3969/j.issn.1674-4926.2004.03.022
2004-01-01
Abstract:The effect of dose on range profiles of medium and low energy ion implantation used in formation of ultra shallow junction is discussed in terms of SIMS measurement and computer simulation. SIMS measurements on different kinds of ion implantation show that the effect of dose on concentration profile has different features. The dose effect is also studied by molecular dynamics simulation. The comparison of computed results with experimental data shows good agreement.
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