Impact test and simulation of protable electronic devices: An assessment

Sheng Liu,Xin Wu,Ronald F. Gibson,Xuefang Wang,Honghai Zhang,Zhiyin Gan,Jianwen Ren,Bin Chen

DOI: https://doi.org/10.1115/IMECE2004-62506

2004-01-01

Abstract:Portable electronics devices are well known to be susceptible to drop impact which can cause various damage modes such as interconnect breakage, battery separation, possible cracking defending along interfaces, display damage, leaking in insulin pump, etc.. Drop impact performance of these products is one of important concerns of product design. Because of the small size of this type of electronics products, it is very expensive, time-consuming and difficult to conduct drop tests to directly detect the failure mechanisms and identify their drop behaviors. A brief review is given in terms of the development in testing standards, material modeling and structure modeling. Barriers and needs are given for both the measurement and modeling, with particular attention to the material rate dependent constitutive modeling, testing facilities development and nonlinear contact mechanics modeling. Copyright © 2004 by ASME.