Abstract:Chip designers typically do not consider design-for-diagnosis (DfD) for manufacturing defects while implementing an integrated circuit and its design-for-test features. The lack of emphasis on DfD results in low diagnosis resolution and limited physical failure analysis (PFA) success rate when diagnosis is carried out using advanced techniques. To the best of our knowledge, no practical solution is available today to analyze the diagnosability of a design and improve it before tapeout. Furthermore, techniques that are specific to a given design cannot be reused for other chips. Therefore, we first propose a general structure-based diagnosability scoring model that can be used to analyze the diagnostic resolution for any chip. After the diag-nosability analysis, we consider inserting additional observation points (OPs) for diagnosability enhancement. Given a constraint on the maximum number of inserted OPs, we propose a three-stage OP insertion (OPI) method, which includes: (i) selection of hard-to-diagnose (HTD) faults; (ii) mixed location ranking based on a structure-based diagnosability “repair” scoring model; (iii) information update and final location selection for a better diagnosability “repair” effect. The use of OPI results in higher fault “repair” rates and significant improvement in diagnosability. Experiments on benchmark circuits and industrial designs demonstrate the effectiveness of the proposed DfD solution.

A Combination of Partial Reset and Observation Point Insertion for Synchronous Sequential Circuits

Partial Reset for Synchronous Sequential Circuits Using Almost Independent Reset Signals

A Clock Isolation Technique for Low Power SoC Design

Non-Scan Design For Testability For Synchronous Sequential Circuits Based On Fault-Oriented Conflict Analysis

Non-Scan Design for Testability for Synchronous Sequential Circuits Based on Conflict Analysis

A Single Event Upset Tolerant Latch with Parallel Nodes.

Efficient observation-point insertion for diagnosability enhancement in digital circuits

Sequential circuit ATPG using combinational algorithms

A Test Generation Approach For Non-Synchronous Sequential Circuit

Nonscan Design for Testability for Synchronous Sequential Circuits Based on Conflict Resolution

Partial Scan Design Based on Circuit State Information

A New Approach to Single Event Effect Tolerance Based on Asynchronous Circuit Technique

Partial Scan Design Based on Circuit State Information and Functional Analysis

A New Family of Sequential Elements with Built-in Soft Error Tolerance for Dual-VDD Systems

Initialization for synchronous sequential circuits based on particle swarm optimization algorithm

A Multiple Phase Partial Scan Design Method

New Method for Low Power Sequential Circuit Design Based on Clock Gating

Low-capture-power At-Speed Testing Using Partial Launch-on-capture Test Scheme

Design of A Low-Power Pulse-Triggered Flip-Flop with Conditional Clock Technique

A Test Set Embedding Approach Based On Twisted-Ring Counter With Few Seeds

A Non-Redundant Latch with Key-Node-Upset Obstacle of Beneficial Efficiency for Harsh Environments Applications