Electrical Properties of Nanocrystalline CeO 2 –Y 2 O 3 Thin Films Prepared by the Sol-Gel Method

H. M. Yue,Z. L. Liu,Y. Wang,K. L. Yao
DOI: https://doi.org/10.1023/A:1024591910056
2003-01-01
Inorganic Materials
Abstract:The nanocrystalline ceria thin films doped with yttria of different concentrations were prepared by using the sol-gel dip-coating method. The complex impedance of the films was measured at various temperatures. It is found that the complex impedance spectroscopies of our nanocrystalline ceria-based thin films show only a residual grain boundary arc, and that the total impedance is increased with an increasing Y 3+ concentration and is decreased as the operating temperature is raised.
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