Effects of Nitrogen on Grown-in Oxygen Precipitates in Large Diameter Czochralski Silicon

余学功,杨德仁,杨建松,马向阳,李立本,阙端麟
DOI: https://doi.org/10.3321/j.issn:0253-4177.2003.01.010
2003-01-01
Abstract:The effect of nitrogen on grown-in oxygen precipitates in large diameter Czochralski (CZ) silicon is investigated. After one-step high temperature annealing and low-high temperature two-step annealing, it is found the behavior of oxygen precipitation in nitrogen-doped CZ (NCZ) silicon is significantly different from that in the conventional CZ silicon. The oxygen precipitation in voids zone is much heavier than that in OSF-ring zone in NCZ silicon after one-step high temperature annealing, while less than that in OSF-ring zone after low-high temperature two-step annealing. It is believed that the size and distribution of grown-in oxygen precipitates are changed by nitrogen doping by the means of vacancies. Based on these facts, the effect mechanism of nitrogen doping on grown-in oxygen precipitates is discussed.
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