Asymmetric, Gate (Ag) Mos Device: A Novel Field Effect Transister (Fet) Structure

Shengqi Yang,Jin He,Ru Huang,Xing Zhang
IF: 1.019
2003-01-01
Chinese Journal of Electronics
Abstract:A novel field effect transistor (FET), named asymmetric gate (AG) MOS device, is proposed in this paper and its excellent performance is demonstrated numerically. Compared with the conventional MOSFET, the presented AG one benefits more from the special design of gate oxide which is divided into two regions, with one region at the source side thicker than that at the drain side. Two-dimensional (2-D) numerical simulations have proved that the short-channel effects (SCE) and the drain-induced barrier lowering (DIBL) can be greatly suppressed just because the channel is screened from the drain potential variations via the unique gate oxide design. Also, a significant electron velocity overshoot is achieved, resulting in higher driving current in the novel structure. It shows that the AG structure will be one of the promising structures in design of MOS devices.
What problem does this paper attempt to address?