Testing of dynamic recording properties for TeOx and Ag-In-Sb-Te-O thin films

Qinghui Li,Donghong Gu,Fuxi Gan,

2003-01-01

Abstract:The recordable disks using TeOx thin films as the recording medium and the erasable disks using Ag-In-Sb-Te-O thin films as the recording medium were fabricated by the methods of vacuum evaporation and by the method of sputtering respectively. Dynamic recording properties of the two kinds of disks at 514.5 nm were reported. The carrier to noise ratio (CNR) of the recordable disk could reach about 30 dB at 514.5 nm and 41 dB at 780 nm; that of the erasable disk could reach about 25 dB at 514.5 nm and 38 dB at 780 nm. The reasons which caused the low CNR were discussed. The two kinds of films had the potential for using as blue-green shortwavelength high density optical storage media.