THE CRYSTALLIZATION BEHAVIOR OF AMORPHOUS Ag11In12Te26Sb51 THIN FILM

刘波,阮昊,干福熹
DOI: https://doi.org/10.3321/j.issn:1005-3093.2002.04.015
2002-01-01
Abstract:The amorphous Ag11In12Te26Sb51 thin films were crystallized by initializer. The crystallization behavior of amorphous Ag11In12Te26Sb51 thin films was investigated by using differential scanning calorimetry (DSC), XRD, and optical transmissivity measurements. For amorphous Ag11In12Te26Sb51 thin film, the crystallization temperature is about 210°C and the melting temperature is 481.7°C. The activation energy for the crystallization, Ea, is 2.07 eV/atom. The crystallization dynamics for Ag11In12Te26Sb51 thin film obeys the law of nucleation and growth reaction. A mixed crystalline, including AgSbTe2, AgInTe2, Sb and Ag2Te phase, was observed during the laser-induced Ag11In12Te26Sb51 phase change process. The initialization power and velocity affect the Ag11In12Te26Sb51 film's crystallization fraction.
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