Study of Optical Constants in Pbsrse Thin Films for Mid-Infrared Laser Application

HF Yang,WZ Shen,QJ Pang
DOI: https://doi.org/10.1088/0953-8984/14/8/332
2002-01-01
Abstract:Spectroscopy measurements of optical constants of molecular-beam-epitaxy-grown PbSrSe thin films have been carried out for mid-infrared laser application. A new and simple empirical model for the refractive index and extinction coefficient of Pb1-xSrxSe thin films, in relation to the band-gap energy, is presented. The model of the optical constants is based on the Lorentz calculation of the imaginary part of the dielectric function. In contrast to other models, our model not only can explain well all of our experimental results with Sr compositions as high as 0.276 and at different temperatures from 10 to 300 K, but also is in good agreement with the reported results for PbSrSe thin films in the literature. Furthermore, we obtain, for the first time, the SrSe thermal expansion coefficient: (7.3±0.3)×10-6 K-1, based on the model and experimental data. The results clearly show promise of being applicable to PbSrSe thin films as well as their microstructures.
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