Abstract:This work marks the first comprehensive explanation of the 3D atomic force micrscopy (3D‐AFM) imaging mechanism for flexible structures. Investigating a 3D model structure featuring suspended carbon nanotube (CNT) provides valuable insights into measuring flexible structures with minimal disturbance. It also presents direct evidence that 3D‐AFM is capable of visualizing vertically overlapped 3D nanostructures. The invention of 3D atomic force microscopy (3D‐AFM) has enabled visualizing subnanoscale 3D hydration structures. Meanwhile, its applications to imaging flexible molecular chains have started to be experimentally explored. However, the validity and principle of such imaging have yet to be clarified by comparing experiments and simulations or cross‐observations with an alternative technique. Such studies are impeded by the lack of an appropriate model. Here, this difficulty is overcome by fabricating 3D carbon nanotube (CNT) structures flexible enough for 3D‐AFM, large enough for scanning electron microscopy (SEM), and simple enough for simulations. SEM and 3D‐AFM observations of the same model provide unambiguous evidence to support the possibility of imaging overlapped nanostructures, such as suspended CNT and underlying platinum (Pt) nanodots. Langevin dynamics simulations of such 3D‐AFM imaging clarify the imaging mechanism, where the flexible CNT is laterally displaced to allow the AFM probe access to the underlying structures. These results consistently show that 3D‐AFM images are affected by the friction between the CNT and AFM nanoprobe, yet it can be significantly suppressed by oscillating the cantilever. This study reinforces the theoretical basis of 3D‐AFM for imaging various 3D self‐organizing systems in diverse fields, from life sciences to interface sciences.

Patterning of Sp(3)- and Sp(2)-Bonded Carbon by Atomic-Force Microscopy

Molecular Dynamics Simulation of Form Measurement Process of Soft Materials Using Atomic Force Microscope

Contribution of Chemical Bonding to the Force in Atomic Force Microscopy

Microwave Atomic Force Microscopy Imaging for Nanometer-Scale Electrical Property Characterization.

Revealing the Mechanism Underlying 3D‐AFM Imaging of Suspended Structures by Experiments and Simulations

Single-Molecule Force Spectroscopy on Poly(acrylic Acid) by AFM

Magnetic and Spin Properties of Tetrahedral Amorphous Carbon

Carbon Films with an Sp(2) Network Structure

Microwave Atomic Force Microscopy: Quantitative Measurement and Characterization of Electrical Properties on the Nanometer Scale

Cross-Sectional Structure Of Tetrahedral Amorphous Carbon Thin Films

AFM force mapping for characterizing patterns of electrostatic charges on SiO2 electrets.

Atomic-resolution Three-Dimensional Force and Damping Maps of Carbon Nanotube Peapods

Nano-fabrication System Based on Atomic Force Microscopy

Scanning Tunnelling Microscopy and Atomic Force Microscopy of Carbondiamond Films

Electron-Energy-Loss Spectroscopy Characterization of the Sp(2) Bonding Fraction Within Carbon Thin Films

A Large-Sample Atomic Force Microscope Observing in Both Air and Liquid

On the Limits of Scalpel AFM for the 3D Electrical Characterization of Nanomaterials

Probing the Nature of Chemical Bonds by Atomic Force Microscopy

Toward the Chemistry of Carboxylic Single-Walled Carbon Nanotubes by Chemical Force Microscopy

Force spectrum of a few chains grafted on an AFM tip: Comparison of the experiment to a self-consistent mean field theory simulation

Studies of High Performance Fibers by Atomic Force Microscopy and Molecular Simulation