Room Temperature Aging Behavior of Thermally Imprinted Pt/SrBi2Ta2O9/Pt Ferroelectric Thin Film Capacitors

D Wu,AD Li,HQ Ling,T Yu,ZG Liu,NB Ming
DOI: https://doi.org/10.1063/1.1402663
IF: 2.877
2001-01-01
Journal of Applied Physics
Abstract:Metalorganic-decomposition-derived SrBi2Ta2O9 (SBT) ferroelectric thin films, sandwiched between Pt electrodes, were imprinted by heat treatment at 130 °C in air. The aging behavior at room temperature of these imprinted SBT capacitors was observed. The voltage shifts of imprinted P–V hysteresis loops increased with the increase of aging time, which indicated the strengthening of the internal bias created by the thermal treatment. With the strengthening of the internal bias, asymmetry of data loss was observed to increase with increasing aging time. The mechanism of the internal bias strengthening, the resultant asymmetric data loss and possible function failure due to this aging behavior were briefly discussed.
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