Field emission performance of diamond film with grid

Wang Weibiao,Jin Changchun,Ji Hong,Yuan Guang,Zhao Haifeng,Fan Xiwu,Liang Jinqiu,Yao Jinsong
DOI: https://doi.org/10.1109/ivmc.1998.728706
1998-01-01
Abstract:The emission performance of a fabricated triode structure device of diamond thin film cold cathode was measured in a vacuum chamber. Diamond film was grown on the (100) silicon substrate with which the resistivity of 5 to approximately 8 Ω·cm by microwave chemical vapor deposited SiO2 as an insulator was deposited onto the diamond surface. Measurements of device's emission properties were solved in superhigh vacuum chamber at pressure of 10-5 Pa. The distance between anode and cathode was about 100 μm.
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