Effect of Interface Roughness and Well Width on Differential Reflection Dynamics in Ingaas/Inp Quantum Wells

YG Zhao,YH Zou,JJ Wang,YD Qin,XL Huang,RA Masut,A Bensaada
DOI: https://doi.org/10.1063/1.120656
IF: 4
1998-01-01
Applied Physics Letters
Abstract:We have observed differential reflection dynamics in In0.518Ga0.492As/InP multiple quantum wells, using the pump–probe technique, and examined the photoluminescence spectra to determine the interface quality for the samples studied. Our results show that the interface quality and well width of the quantum wells (QWs) strongly influence the differential reflection dynamics. The experimental results provide a direct evidence to demonstrate that photoexcited carrier diffusion in cap layer and barriers along the direction perpendicular to sample surface plays a dominant role in determining the differential reflection dynamics of the QWs.
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