How the Surface Resistance R s of Patterned High- T c Superconducting Thin Film Is Affected by the Film's Edge

B. B. Jin,R. X. Wu
DOI: https://doi.org/10.1023/A:1022696220632
1998-01-01
Journal of Superconductivity
Abstract:This paper defines an effective microwave surface resistance R_s^eff for the nonuniform distribution of microwave surface resistance R s in the strip of a microstrip. It is proved that R_s^eff is equivalent to the expression of R s used in experiments, and that the R_s^eff is dominated by the edge part, i.e., the area of width λ 2 /2 t from the strip edge, where λ is the magnetic penetration depth and t is the film thickness. Under the assumption that R_s ∼( H_rf^y )^n where H_rf^y is the component of rf magnetic field along the film thickness and n is an integer, the ratio of the contributions of the edge part and the rest of the strip to R_s^eff is calculated by using an approximate analytical expression of the surface current density distribution J s in the strip and H_rf^y calculated by the London equation. The effect of film's edge on R s was studied using a microstrip resonator. It is found that the perfectness of the edge could affect the magnitude of the power dependence of R s significantly, which agreed with our analysis.
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