THE MEASURING PRECISION ANALYSIS OF SURFACE RESISTANCE IN MICROWAVE BAND BASED ON IEC/TC90

JI ZHENG-MING,WU PEI-HENG,XU WEI-WEI,SUN GUO-HU,GUO DA-YUAN
DOI: https://doi.org/10.3969/j.issn.1000-3258.2005.z1.063
2005-01-01
Abstract:As the surface resistance R -s of high T_c superconductor films in microwave band is of primary importance for the development of new materials on the supplier side and for the design of superconductor microwave components on the customer side, the International Electro technical Commission have made the standard of the electronics characteristic measurement surface resistance of high T_c superconductor at microwave frequencies, IEC/TC90, which measures the R -s of superconductor thin film by using a resonator made of sapphire dielectric-pole and superconductor thin films, based on the principle of measurement of surface impedance through dielectric-pole resonators.In this paper we describedthe precision of all the measuring-variablesin the measurement procedure and the target precision of R -s of calculation accordingthe experiment data. We noticedthat the background level (mainly unwanted cavity modes) is critical to the Q value measurement. Unwanted,parasitic coupling to the other modes reduces the high Q value of the TE mode resonator.For the target precision of 20%, the background levelmust less than 40dB.
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