Abstract:We have developed a low temperature, high-resolution microwave surface impedance probe that is able to operate in high static magnetic fields. Surface impedance is measured by cavity perturbation of dielectric resonators, with sufficient sensitivity to resolve the microwave absorption of sub-mm-sized superconducting samples. The resonators are constructed from high permittivity single-crystal rutile (TiO2) and have quality factors in excess of 10^6. Resonators with such high performance have traditionally required the use of superconducting materials, making them incompatible with large magnetic fields and subject to problems associated with aging and power-dependent response. Rutile resonators avoid these problems while retaining comparable sensitivity to surface impedance. Our cylindrical rutile resonators have a hollow bore and are excited in TE_01(n-d) modes, providing homogeneous microwave fields at the center of the resonator where the sample is positioned. Using a sapphire hot-finger technique, measurements can be made at sample temperatures in the range 1.1 K to 200 K, while the probe itself remains immersed in a liquid helium bath at 4.2 K. The novel apparatus described in this article is an extremely robust and versatile system for microwave spectroscopy, integrating several important features into a single system. These include: operation at high magnetic fields; multiple measurement frequencies between 2.64 GHz and 14.0 GHz in a single resonator; excellent frequency stability, with typical drifts < 1 Hz per hour; the ability to withdraw the sample from the resonator for background calibration; and a small pot of liquid helium separate from the external bath that provides a sample base temperature of 1.1 K.

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Research on Effective Area of Surface Resistance Measurement of Superconducting Thin Film at Microwave Frequencies

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Spatially Resolved Analyses of Microwave and Intermodulation Current Flow Across HTS Resonator Using Low Temperature Laser Scanning Microscopy

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ERROR ANALYSIS FOR MEASUREMENTS OF MICROWAVE SURFACE RESISTANCE OF HIGH-TEMPERATURE SUPERCONDUCTORS BY DIELECTRIC RESONATOR METHOD

Fabrication and testing of a novel silicon probe for micromachined surface profilers.

Apparatus for high resolution microwave spectroscopy in strong magnetic fields

Microwave Hall measurements using a circularly polarized dielectric cavity

Non-resonant phase sensitive approach for time resolved microwave conductivity in photoactive thin films

Review and Modification of Permittivity Measurement on Open Resonator for Transparent Material Measurements at Terahertz

Frequency-domain probe beam deflection method for measurement of thermal conductivity of materials on micron length scale