Effects of Grain Boundaries on Temperature Dependence of Microwave Surface Resistance of YBa2Cu3O7-x Thin Films

M Ben Tunyiswa,K Nakajima,J Chen,SJ Kim,HB Wang,T Yamashita
DOI: https://doi.org/10.1143/jjap.37.5540
IF: 1.5
1998-01-01
Japanese Journal of Applied Physics
Abstract:This paper investigates the temperature dependence of microwave surface resistance (R S) of YBa2Cu3O7-x (YBCO) thin films with different microstructures at 10 GHz, using a coplanar resonator technique. YBCO thin films with different grain sizes were obtained as a result of changing the quenching procedure after film deposition by dc sputtering. The value of R S was found to vary with varying surface morphology and can be explained by the coupled grain model (CGM) when a temperature-dependent grain boundary resistance (R) is used. The temperature (T) dependence of R is given by R=R 0+C(T/T C)2 T, where T C is the superconducting critical temperature, and R 0 and C are the fitting parameters, depending on the properties of each sample.
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