Abstract:Ion beam-assisted deposition (IBAD) has been proposed as a promising texturing technology that uses the film epitaxy method to obtain biaxial texture on a non-textured metal or compound substrate. Magnesium oxide (MgO) is the most well explored texturing material. In order to obtain the optimal biaxial texture, the actual thickness of the IBAD-MgO film must be controlled within 12nm. Due to the bombardment of ion beams, IBAD-MgO has large lattice deformation, poor texture, and many defects in the films. In this work, the solution deposition planarization (SDP) method was used to deposit oxide amorphous Y2O3 films on the surface of Hastelloy C276 tapes instead of the electrochemical polishing, sputtering-Al2O3 and sputtering-Y2O3 in the commercialized buffer layer. An additional homogeneous epitaxy MgO (epi-MgO) layer, which was used to improve the biaxial texture in the IBAD-MgO layer, was deposited on the IBAD-MgO layer by electron-beam evaporation. The effects of growth temperature, film thickness, deposition rate, and oxygen pressure on the texture and morphology of the epi-MgO film were systematically studied. The best full width at half maximum (FWHM) values were 2.2° for the out-of-plane texture and 4.8° for the in-plane texture for epi-MgO films, respectively. Subsequently, the LaMnO3 cap layer and YBa2Cu3O7-x (YBCO) functional layer were deposited on the epi-MgO layer to test the quality of the MgO layer. Finally, the critical current density of the YBCO films was 6 MA/cm2 (77 K, 500 nm, self-field), indicating that this research provides a high-quality MgO substrate for the YBCO layer.

Deposition of biaxially aligned YSZ layers on polycrystalline metallic substrate

Low energy ion beam assisted deposition of biaxially aligned YSZ and CeO2/YSZ films on r-plane sapphire

Characterisation of YSZ Layers Deposited on Y2O3 Buffered Textured Tapes for Coated Conductors

Deposition of high-textured buffer layers for YBCO coated conductors by all-IPAT-process

Reel-To-Reel Deposition of Epitaxial Double-Sided Y2o3 Buffer Layers for Coated Conductors

Growth of Biaxially Textured Yttria-Stabilized Zirconia Thin Films on Si(111) Substrate by Ion Beam Assisted Deposition

Crystalline Alignment and In-plane Texture Improvement of Buffer Layers Deposited on NiW Tapes

Growth Mechanism of IBAD-YSZ Thin Film on Hastelloy Substrates

Epitaxial growth of YSZ buffer layer for YBa2Cu3O7-δ coated conductor by reel to reel pulsed laser deposition

Improvement of Surface Morphology of Yttrium-Stabilized Zirconia Films Deposited by Pulsed Laser Deposition on Rolling Assisted Biaxially Textured Substrate Tapes

Metal Organic Deposition of Lanthanum Zirconate Buffer Layer on Biaxially Textured Ni-5%W Substrate

Texture and Morphology Developments of Yttria-stabilized Zirconia (YSZ) Buffer Layer for Coated Conductors by RF Sputtering

In-Plane Aligned Ybco Tape On Textured Ysz Buffer Layer Deposited On Nicr Alloy Substrate By Laser Ablation With Only O+ Ion Beam Assistance

In-plane Aligned YBCO Film on Textured YSZ Buffer Layer Deposited on NiCr Alloy Tape by Laser Ablation with Only O+ion Beam Assistance

Fabrication of YBCO Coated Conductors on Biaxial Textured Metal Substrate by All-Sputtering

RECENT PROGRESS IN COATED CONDUCTORS BY IBAD METHOD AND THE PREPARATION OF LONG YSZ/HASTELLOY SUBSTRATES

A Simple One-Step Heat Treatment Process for Preparing Biaxially Textured Buffer Layers on Rolled Ni Tape for High Tc Coated Conductors’ Application

Rapid Deposition of Buffer Layers for YBCO Coated Conductors on Biaxially-Textured Ni Tapes

A Novel Process for Ceo2 Single Buffer Layer on Biaxially Textured Metal Substrates in Ybco Coated Conductors

MOCVD Derived Double-Sided YBa2Cu3O7−δ Films on Y2O3/YSZ/CeO2 Buffered Textured Metal Substrates

Preparation of MgO Self-Epitaxial Films for YBCO High-Temperature Coated Conductors