MOCVD Derived Double-Sided YBa2Cu3O7−δ Films on Y2O3/YSZ/CeO2 Buffered Textured Metal Substrates

Jie Xiong,Fei Zhang,YuDong Xia,Xin Liu,RuiPeng Zhao,XiaoHui Zhao,BoWan Tao
DOI: https://doi.org/10.1007/s11431-014-5488-2
2014-01-01
Abstract:We have successfully employed metal-organic chemical vapor deposition (MOCVD) technique to simultaneously deposit double-sided YBa 2 Cu 3 O 7− δ (YBCO) films on both sides of Y 2 O 3 /yttria-stabilized zirconia (YSZ)/CeO 2 (YYC) buffered biaxially textured Ni-5 at.% W substrates, which is of great prospect to cut the production cost of YBCO coated conductors. X-ray diffraction analysis revealed that both sides of YBCO film were purely c -axis oriented and highly textured. The ω -scan of (005) YBCO and ϕ -scan of (103) YBCO yielded full width at half maximum (FWHM) values of 4.9° and 6.6° for one side of double-sided YBCO film, respectively, as well as 4.4° and 6.4° for the other side. The current transportation measurements performed on such double-sided 500 nm-thickness YBCO films showed the self-field critical current density ( J c ) at 77 K of 0.6 MA/cm 2 and 1.2 MA/cm 2 , respectively. Further research is in the process of exploring new solution to improve the J c in practice.
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