Nondestructive Imaging of Periodic Profiles of Dielectric Constant and Ferroelectric Domains Using a Scanning Tip Microwave Near-Field Microscope

Xiaodong Xiang,L. U. Yalin,Tao Wei,Fred W. Duewer,L. U. Yanqing,Peter G. Schultz,Naiben Ming

1997-01-01

Scanning

Abstract:null

What problem does this paper attempt to address?

Nondestructive Imaging of Dielectric-Constant Profiles and Ferroelectric Domains with a Scanning-Tip Microwave Near-Field Microscope

YL Lu,T Wei,F Duewer,YQ Lu,NB Ming,PG Schultz,XD Xiang

DOI: https://doi.org/10.1126/science.276.5321.2004

IF: 56.9

1997-01-01

Science

Abstract:Variations in dielectric constant and patterns of microwave loss have been imaged in a yttrium-doped LiNbO 3 crystal with periodic ferroelectric domains with the use of a scanning-tip near-field microwave microscope. Periodic profiles of dielectric constant and images of ferroelectric domain boundaries were observed at submicrometer resolution. The combination of these images showed a growth-instability–induced defect of periodic domain structure. Evidence of a lattice-edge dislocation has also been observed through a stress-induced variation in dielectric constant.
Nondestructive Imaging of the Microwave Properties of Superconducting Thin Film Devices with a Scanning Microwave Near-Field Microscope

YJ Feng,L Liu,QG Liu,LX You,L Kang,SZ Yang,PH Wu

DOI: https://doi.org/10.1016/s0921-4534(00)01438-6

2000-01-01

Physica C Superconductivity

Abstract:In this paper, nondestructive microwave scanning techniques have been used to image the local microwave properties of planar microwave devices. A coaxial cavity, together with a niobium tip, has been used as a probe in the scanning microwave near-field microscope. Quantitative images of the dielectric constant of the substrates as well as the variations of the surface resistance of the line patterns in the metal multilayers have been obtained. Local surface resistances at 3GHz have been measured on microwave devices prepared with laser ablated YBaCuO thin films, which helps in evaluating the performance of the devices.
High Frequency Dielectric Properties Distribution of Bifeo3 Thin Film Using Near-Field Microwave Microscopy

Xiao-Yu Zhang,Xuan-Cong Wang,Feng Xu,Yun-Gui Ma,C. K. Ong

DOI: https://doi.org/10.1063/1.3258201

2009-01-01

Abstract:A near-field scanning microwave microscopy (NSMM) is applied to investigate the local perpendicular dielectric information of single-phase multiferroic BiFeO(3) thin film and single crystal LaAlO(3) material. Our NSMM is composed of a vector network analyzer and a simple open-ended coaxial probe, which is quite different from the commercial probe with a lambda/4 coaxial resonator. The local permittivity is calculated quantitatively according to resonance frequency shift under the quasistatic microwave perturbation theory. We make use of the magnitude of reflection loss S(11) to construct an image reflecting the distribution of dielectric constant of a material. A homogeneous permittivity is observed in LaAlO(3) material and the inhomogeneous permittivity epsilon=215-250 for BiFeO(3) film is depicted from the change of feedback signal S(11) over an area of 100x100 microm(2).
Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope

D. E. Steinhauer,C. P. Vlahacos,F. C. Wellstood,Steven M. Anlage,C. Canedy,R. Ramesh,A. Stanishevsky,J. Melngailis

DOI: https://doi.org/10.1063/1.1150687

2000-04-27

Abstract:We describe the use of a near-field scanning microwave microscope to image the permittivity and tunability of bulk and thin film dielectric samples on a length scale of about 1 micron. The microscope is sensitive to the linear permittivity, as well as to nonlinear dielectric terms, which can be measured as a function of an applied electric field. We introduce a versatile finite element model for the system, which allows quantitative results to be obtained. We demonstrate use of the microscope at 7.2 GHz with a 370 nm thick barium strontium titanate thin film on a lanthanum aluminate substrate. This technique is nondestructive and has broadband (0.1-50 GHz) capability. The sensitivity of the microscope to changes in relative permittivity is 2 at permittivity = 500, while the nonlinear dielectric tunability sensitivity is 10^-3 cm/kV.

Materials Science
The Scanning Tip Microwave Near-Fielid Microscopy Of Ferroelectromagnetic Pb(Fe1/2nb1/2)O-3 Crystals

yang yang,s t zhang,h b huang,j m liu,z g liu

DOI: https://doi.org/10.1142/S0219581X04002772

2004-01-01

Abstract:Scanning tip near-field microwave microscope (STMNM) was employed to obtain the nanoscale dielectric constant profile of Pb(Fe1/2Nb1/2)O-3 (PFN) single crystal. The observed pseudo-periodic profiles of the dielectric constant indicate the existence of ferroelectric domains. The low dielectric constant area is supposed to have some relation with the antiferromagnetic property of PFN and the appearance of magnetic hysteresis below the Neel temperature implies the formation of magnetic order. The Mossbauer spectra show that the iron ions are in trivalence high spin state. The appearance of the sextet confirms the magnetic order existed in PFN under its Neel temperature.
Superconducting Material Diagnostics using a Scanning Near-Field Microwave Microscope

Steven M. Anlage,D. E. Steinhauer,C. P. Vlahacos,B. J. Feenstra,A. S. Thanawalla,Wensheng Hu,Sudeep K. Dutta,F. C. Wellstood

DOI: https://doi.org/10.1109/77.783934

1998-11-11

Abstract:We have developed scanning near-field microwave microscopes which can image electrodynamic properties of superconducting materials on length scales down to about 2 $\mu$m. The microscopes are capable of quantitative imaging of sheet resistance of thin films, and surface topography. We demonstrate the utility of the microscopes through images of the sheet resistance of a YBa2Cu3O7-d thin film wafer, images of bulk Nb surfaces, and spatially resolved measurements of Tc of a YBa2Cu3O7-d thin film. We also discuss some of the limitations of the microscope and conclude with a summary of its present capabilities.

Materials Science,Superconductivity
Microwave Atomic Force Microscopy Imaging for Nanometer-Scale Electrical Property Characterization.

Lan Zhang,Yang Ju,Atsushi Hosoi,Akifumi Fujimoto

DOI: https://doi.org/10.1063/1.3525058

2010-01-01

Abstract:We introduce a new type of microscopy which is capable of investigating surface topography and electrical property of conductive and dielectric materials simultaneously on a nanometer scale. The microwave atomic force microscopy is a combination of the principles of the scanning probe microscope and the microwave-measurement technique. As a result, under the noncontact AFM working conditions, we successfully generated a microwave image of a 200-nm Au film coating on a glass wafer substrate with a spatial resolution of 120 nm and a measured voltage difference of 19.2 mV between the two materials.
Near-field to far-field subwavelength imaging using Non-radiative Dielectric Waveguide probe

Yew Li Hor,Li, E.P.,Hoefer, W.J.R.

DOI: https://doi.org/10.1109/IRMMW-THz.2012.6380475

2012-01-01

Abstract:High-resolution imaging of an object smaller than the wavelength requires that evanescent near-field information be transmitted from the vicinity of the object to the plane in which the image is formed, which is usually in the far-field region. Here, we demonstrate the well-known Non-radiative Dielectric Waveguide for capturing and transmitting near-field information into the far-field region using full-wave time domain simulations. The results show that the tapered NRD section can transfer evanescent near-field information into the far-field. This investigation has potential application for terahertz sensing as well as the design of optical system and components in the visible regime.
Nondestructive Evaluation of the Dielectric Properties of the Substrate Materials for High-T-C Superconducting Microwave Devices

YJ Feng,LY Wu,T Jiang,L Liu,L Kang,SZ Yang,PH Wu

DOI: https://doi.org/10.1088/0953-2048/15/3/321

2002-01-01

Abstract:In this paper, microwave near-field scanning technique has been employed to study the local dielectric properties of the substrate materials for superconducting microwave devices. A coaxial cavity together with a niobium tip has been used as a probe in our scanning microwave near-field microscope (SMNFM). Using the SMNFM, quantitative measurement of both the relative permittivity and the loss tangent of various substrate materials for the high-temperature superconducting thin films have been obtained, which coincide with the data reported in the literature quite well. Nondestructive imaging of the dielectric properties of the substrate is also given with a spatial resolution of several micrometres. We believe that the SMNFM is a reliable method for nondestructively evaluating the dielectric properties of the substrates in the microwave circuit devices. It will be helpful to better understand the influences of the variations and defects in the substrates on the designing and performance of the superconducting microwave devices.
Penetrative Imaging Of Sub-Surface Microstructures With A Near-Field Microwave Microscope

weiqiang sun,yong yang,zhe wu,tao feng,qianwei zhuang,lianmao peng,shengyong xu,c k ong

DOI: https://doi.org/10.1063/1.4891215

IF: 2.877

2014-01-01

Journal of Applied Physics

Abstract:Microwaves have the capability of penetrating through materials with low permittivity. By means of a near-field scanning microwave microscope system, we obtained two-dimensional maps of the incident microwave's reflection coefficient intensity and frequency shift, which correspond well to the spatial distribution and electrical conductance of fluids and metallic thin film structures hidden underneath 15-170 mu m thick dielectric covers. The lateral resolution and sensitivity to conductivity for the target samples were found closely related to the thickness of the cover layer. The technique offers a real-time, in-situ, and a non-invasive approach to monitor the local chemical reactions, the motion of fluids, and the distribution or concentrations of ions or bio-materials in lab-on-a-chip systems. This technique also has the potential to be developed for the detection of live cells and tissues. (C) 2014 AIP Publishing LLC.
Simultaneously imaging of dielectric properties and topography in a PbTiO_3 crystal by near-field scanning microwave microscopy

Y. G. Wang,M. E. Reeves,F. J. Rachford,Y.G. Wang,F.J. Rachford

DOI: https://doi.org/10.48550/arXiv.cond-mat/0002272

2000-02-17

Materials Science

Abstract:We use a near-field scanning microwave microscope to simultaneously image the dielectric constant, loss tangent, and topography in a PbTiO_3 crystal. By this method, we study the effects of the local dielectric constant and loss tangent in the geometry of periodic domains on the measured resonant frequency, and quality factor. We also carry out theoretical calculations and the results agree well with the experimental data and reveal the anisotropic nature of dielectric constant.
Probing the Local Microwave Properties of Superconducting Thin Films by a Scanning Microwave Near-Field Microscope

LY Wu,YJ Feng,KL Wang,T Jiang,L Kang,SZ Yang,PH Wu

DOI: https://doi.org/10.1088/0953-2048/15/12/330

2002-01-01

Abstract:In this paper, we present our approach to probe the local microwave properties of superconducting thin films by using the microwave near-field scanning technique. We have employed a coaxial cavity together with a niobium tip as the probe and established a scanning sample stage cooled by liquid nitrogen to study thin film devices at low temperature in our scanning microwave near-field microscope. Nondestructive images have been obtained on the inhomogeneity of the YBaCuO superconducting thin films at microwave frequency. We believe that these results would be helpful in evaluating the microwave performance of the devices.
Far-field Characterization of Material Permittivity Based on Nonlinear Inversions

Yingchao Xie,Qingyang Meng,Kuiwen Xu,Lixin Ran,Jun Wang

DOI: https://doi.org/10.1109/COMPEM.2019.8779050

2019-01-01

Abstract:Noncontact measurement of complex permittivity at microwave frequencies is significantly important in various areas of scientific research and engineering applications. In this work, we experimentally investigate a noncontact solution based on nonlinear inversion algorithms which is used in through wall imaging (TWI). Experiments are performed using a setup with the object surrounded by a closed wall. The inversion is based on a twofold subspace-based optimization method, and the results show that the complex permittivity of the object can be successfully retrieved from the measured data. This TWI solution can be modified to achieve a noncontact measurement method.
THE SCANNING TIP MICROWAVE NEAR-FIELD MICROSCOPY OF FERROELECTROMAGNETIC Pb(Fe1/2Nb1/2)O3 CRYSTALS

Y. YANG,S. T. ZHANG,H. B. HUANG,J.-M. LIU,Z. G. LIU

DOI: https://doi.org/10.1142/s0219581x04002772

2004-01-01

International Journal of Nanoscience

Abstract:Scanning tip near-field microwave microscope (STMNM) was employed to obtain the nanoscale dielectric constant profile of Pb ( Fe 1/2 Nb 1/2) O 3 (PFN) single crystal. The observed pseudo-periodic profiles of the dielectric constant indicate the existence of ferroelectric domains. The low dielectric constant area is supposed to have some relation with the antiferromagnetic property of PFN and the appearance of magnetic hysteresis below the Néel temperature implies the formation of magnetic order. The Mössbauer spectra show that the iron ions are in trivalence high spin state. The appearance of the sextet confirms the magnetic order existed in PFN under its Néel temperature.
Measurement of Surface Acoustic Wave Resonances in Ferroelectric Domains by Microwave Microscopy

Scott R. Johnston,Yongliang Yang,Yong-Tao Cui,Eric Yue Ma,Thomas Kämpfe,Lukas M. Eng,Jian Zhou,Yan-Feng Chen,Minghui Lu,Zhi-Xun Shen

DOI: https://doi.org/10.1063/1.4997474

2017-05-02

Abstract:Surface Acoustic Wave (SAW) resonances were imaged within a closed domain in the ferroelectric LiTaO$_3$ via scanning Microwave Impedance Microscopy (MIM). The MIM probe is used for both SAW generation and measurement, allowing contact-less measurement within a mesoscopic structure. Measurements taken over a range of microwave frequencies are consistent with a constant acoustic velocity, demonstrating the acoustic nature of the measurement.

Materials Science
Local Permittivity Measurement of Dielectric Materials Based on the Non-Contact Force Curve of Microwave Atomic Force Microscopy

Bo Tong,Minji Zhao,Yuhki Toku,Yasuyuki Morita,Yang Ju

DOI: https://doi.org/10.1063/1.5066599

2019-01-01

Abstract:We report a non-contact and quantitative method to measure the local permittivity of dielectric materials with a nanometer-scale spatial resolution. A theoretical model based on near-field approximation was developed to describe the effect of a microwave on the interaction between a probe and a sample. Under the non-contact mode, we successfully measured the force curves of Si, Al2O3, Ge, and ZrO2 using microwave atomic force microscopy and observed the variation in the force caused by the microwave. According to the established theoretical model, a quantitative non-contact evaluation of the local permittivity of dielectric materials was performed.
Simultaneous Observation of Nanocrystalline BaTiO3 Ceramics Surface Morphology and Ferroelectricity Using Scanning Nonlinear Dielectric Microscopy

Changjiang Xiao,Zhengxin Li,Xiangrong Deng

DOI: https://doi.org/10.4028/www.scientific.net/amr.146-147.1252

2010-01-01

Advanced Materials Research

Abstract:A scanning nonlinear dielectric microscopy (SNDM) with an additional electrically conducting atomic force microscope cantilever as a probe needle is adopted to simultaneously observe the surface topographic and domain images of nanocrystalline BaTiO3 ceramics with super-high resolution. The sample exhibits a uniform grain size distribution and the average grain sizes are calculated to be about 30 nm. Some regions are brighter than the others in SNDM image, indicating the existence of ferroelectric domains structure. In addition, P-E hysteresis and piezoresponse loops are found in nanocrystalline BaTiO3 ceramics. The experimental results demonstrate that the SNDM with the function of atomic force microscopy is very useful for understanding domain structures of nanocrystalline ferroelectric materials.
Learning-Based Subsurface Quantitative Imaging via Near-Field Scanning Microwave Microscopy

Yulong Zhou,Ning Leng,Zhun Wei,Xiuzhu Ye,Tiantian Yin,Ming Bai,Xudong Chen

DOI: https://doi.org/10.1109/tmtt.2022.3184289

IF: 4.3

2022-11-01

IEEE Transactions on Microwave Theory and Techniques

Abstract:Accurate characterization of sample dielectric property is essential for scientists and engineers to analyze and evaluate the performance of the invested sample. This article proposes a learning-based (LB) method for quantitative subsurface imaging via coaxial-resonator-based near-field scanning microwave microscopy (CR-NFSMM) in a nondestructive way. To efficiently generate the database, a well-designed forward solver is critical since many samples will be included in the database, each sample needs a scanning procedure, and each scanning point involves solving the forward problem once. A fast forward problem solver is used to evaluate the tip–sample interaction in CR-NFSMM that avoids repeated meshing during the scanning process and it can apply to an arbitrary tip shape. Once the neural network is trained, it generates the reconstructed image within 1 s. Numerical and experimental results show that the proposed LB method could improve the resolution of the image and recover the dielectric properties of the subsurface perturbation pixel-by-pixel. Moreover, the proposed method outperforms the traditional objective function approach in terms of image resolution and time cost. The proposed method is promising to realize a nondestructive and real-time local dielectric evaluation of the subsurface object.

engineering, electrical & electronic
Parameter-free extraction of Thin-Film Dielectric Constants from Scanning Near Field Microwave Microscope Measurements

Shuogang Huang,H. M. Christen,M. E. Reeves

DOI: https://doi.org/10.48550/arXiv.0909.3579

2009-09-19

Materials Science

Abstract:We present a method for extracting high-spatial resolution dielectric constant data at microwave frequencies. A scanning near field microwave microscope probes a sample and acquires data in the form of the frequency and quality factor shifts of a resonant cavity coupled to the sample. The approach reported here is to calculate the electromagnetic fields by the finite element method in both static and time-dependent modes. Cavity perturbation theory connects the measured frequency shifts to changes in the computed energy stored in the electromagnetic field. In this way, the complex permittivity of the sample is found. Of particular interest are thin-film materials, for which a method is reported here to determine the dielectric constant without the need to use any fitting parameters.
Temperature-dependent local electromagnetic characterization of electronic materials by scanning microwave near-field technique

Y.J. Feng,T. Jiang,J. Sun,L.Y. Wu,K.L. Wang

DOI: https://doi.org/10.1016/j.mseb.2005.04.017

2005-01-01

Abstract:We report a scanning microwave near-field microscope that allows temperature-dependent local electromagnetic characterization of electronic materials. We have established a temperature-controlled sample stage cooled by liquid nitrogen, so that the local electromagnetic properties of the sample could be studied through near-field microwave interaction at temperature varying from 80 to 300K. Using this instrument, we have studied the magnetic phase transition of an Nd0.7Sr0.3MnO3−δ thin film and an ion-pair complex magnetic material, as well as the homogeneity of the microwave surface resistance of a YBa2Cu3O7−δ superconducting thin film. Experiment results have demonstrated the ability of temperature-dependent local microwave characterization of this microwave microscope for different kind of electronic materials.

Nondestructive Imaging of Periodic Profiles of Dielectric Constant and Ferroelectric Domains Using a Scanning Tip Microwave Near-Field Microscope

Nondestructive Imaging of Dielectric-Constant Profiles and Ferroelectric Domains with a Scanning-Tip Microwave Near-Field Microscope

Nondestructive Imaging of the Microwave Properties of Superconducting Thin Film Devices with a Scanning Microwave Near-Field Microscope

High Frequency Dielectric Properties Distribution of Bifeo3 Thin Film Using Near-Field Microwave Microscopy

Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope

The Scanning Tip Microwave Near-Fielid Microscopy Of Ferroelectromagnetic Pb(Fe1/2nb1/2)O-3 Crystals

Superconducting Material Diagnostics using a Scanning Near-Field Microwave Microscope

Microwave Atomic Force Microscopy Imaging for Nanometer-Scale Electrical Property Characterization.

Near-field to far-field subwavelength imaging using Non-radiative Dielectric Waveguide probe

Nondestructive Evaluation of the Dielectric Properties of the Substrate Materials for High-T-C Superconducting Microwave Devices

Penetrative Imaging Of Sub-Surface Microstructures With A Near-Field Microwave Microscope

Simultaneously imaging of dielectric properties and topography in a PbTiO_3 crystal by near-field scanning microwave microscopy

Probing the Local Microwave Properties of Superconducting Thin Films by a Scanning Microwave Near-Field Microscope

Far-field Characterization of Material Permittivity Based on Nonlinear Inversions

THE SCANNING TIP MICROWAVE NEAR-FIELD MICROSCOPY OF FERROELECTROMAGNETIC <font>Pb</font>(<font>Fe</font><sub>1/2</sub><font>Nb</font><sub>1/2</sub>)<font>O</font><sub>3</sub> CRYSTALS

Measurement of Surface Acoustic Wave Resonances in Ferroelectric Domains by Microwave Microscopy

Local Permittivity Measurement of Dielectric Materials Based on the Non-Contact Force Curve of Microwave Atomic Force Microscopy

Simultaneous Observation of Nanocrystalline BaTiO3 Ceramics Surface Morphology and Ferroelectricity Using Scanning Nonlinear Dielectric Microscopy

Learning-Based Subsurface Quantitative Imaging via Near-Field Scanning Microwave Microscopy

Parameter-free extraction of Thin-Film Dielectric Constants from Scanning Near Field Microwave Microscope Measurements

Temperature-dependent local electromagnetic characterization of electronic materials by scanning microwave near-field technique