Si1-Xgex/Si Asymmetric 2x2 Electrooptical Switch Of Total Internal-Reflection Type

Yong Gao,Xiding Liu,Guozheng Li,Enke Liu,Xiangjiu Zhang,Xuekun Lu,Jihuang Hu,Xun Wang
DOI: https://doi.org/10.1063/1.114899
IF: 4
1995-01-01
Applied Physics Letters
Abstract:Based on plasma dispersion of Si1-xGex, we have fabricated asymmetric 2X2 switches of total internal reflection type, in which Si1-xGex was grown by molecular beam epitaxy. The optimum intersecting angle is 4 degrees, and the crosstalk is less than -10.6 dB at 76 mA injection current. The insertion loss is 2.8 dB, and the switch time is 0.6 mu s. (C) 1995 American Institute of Physics.
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