ZrO2-TiO2 thin films: A new material system for mid-infrared integrated photonics

Ningyuan Duan,Hongtao Lin,Lan Li,Juejun Hu,Lei Bi,Haipeng Lu,Xiaolong Weng,Jianliang Xie,Longjiang Deng
DOI: https://doi.org/10.1364/OME.3.015370
2013-01-01
Optical Materials Express
Abstract:Mid-infrared (MIR, 2 - 6 mu m wavelength) transparent metal oxides are attractive materials for planar integrated MIR photonic devices and sensing applications. In this report, we present reactive sputtering deposited ZrO2-TiO2 (ZTO) thin films as a new material candidate for integrated MIR photonics. The material structure and optical properties were systematically studied as a function of Ti concentration. The thin film index of refraction monotonically increases with Ti concentration, while the film crystallinity decreases. Fully amorphous ZTO films were achieved with 40 at.% Ti doping on various substrates. MIR micro-disk resonators on MgO substrates were demonstrated using Zr0.6Ti0.4O2 strip-loaded waveguides with a loaded quality factor of similar to 11,000 at 5.2 mu m wavelength. (c) 2013 Optical Society of America
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