Growth of Epitaxial C-Plane Zno Film on A-Plane Sapphire by Radio Frequency Reactive Magnetron Sputtering

Hongyan Liu,Shuang Gao,Fei Zeng,Cheng Song,Feng Pan
DOI: https://doi.org/10.1002/pssr.201307197
2013-01-01
Abstract:In this Letter, we report the successful growth of high quality c -plane oriented epitaxial ZnO films on a -plane sapphire substrates by using radio frequency reactive magnetron sputtering. The effect of substrate temperature on the structural and optical properties has been investigated. X-ray diffraction (XRD) studies reveal that the ZnO film is grown epitaxially on a -plane sapphire substrate, and the film quality is improv- ed as the substrate temperature is increased. Photoluminescence (PL) results manifest that screw dislocations can exert great influence on the optical properties. It is found that the line width of the near-band-edge emission of PL decreases linearly with increase in screw density. In addition, a simple and effective method is proposed to assess the defect density in epitaxial ZnO films by performing PL measurement. (C) 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
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