Young'S Modulus and Residual Stress of Mems Gold Beams Based on the Gaas Mmic Process

Gang Yang,Xiaoping Liao,Zhiqiang Zhang
DOI: https://doi.org/10.1088/0960-1317/23/4/045002
2013-01-01
Journal of Micromechanics and Microengineering
Abstract:This paper proposes the theory, simulation, fabrication and measurements of Young's modulus and the residual stress of the GaAs monolithic microwave integrated circuit (MMIC)-based microelectromechanical systems (MEMS) gold beams. In this paper, some cantilever and bridge MEMS gold beams with different lengths are fabricated in order to measure Young's modulus and the residual stress, which is completely compatible with the GaAs MMIC process. In the measurement, the resonance method is utilized due to the non-destruction and the high accuracy. These measurements are analyzed using analytical beam theory. After the evaluation process, the accuracy of the measurement results is discussed.
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