The Temperature-Dependent Photoresponse Uniformity of an Ingaas Subpixels Infrared Detector by the Lbic Technique

Honghai Deng,Hengjing Tang,Tao Li,Xue Li,Peng Wei,Yaoming Zhu,Haimei Gong
DOI: https://doi.org/10.1088/0268-1242/27/11/115018
IF: 2.048
2012-01-01
Semiconductor Science and Technology
Abstract:The front-illuminated InP/InGaAs/InP PIN hetero-junction photovoltaic subpixels infrared detector has been achieved based on the lateral collection effect of photogenerated carriers. The photoresponse uniformity of the detector is carried out with a LBIC technique at different temperatures between 88 K and 296 K. With the aid of LBIC and the scanning capacitance microscopy (SCM) technique, the holes diffusion length L-p related to temperature was obtained. The result shows that the photoresponse uniformity decreases with temperature dropping, and L-p also varies directly in proportional to root T. The acoustic phonon scattering is the chief scattering mechanism existing in the detector with doped InGaAs (n approximate to 5x10(16) cm(-3)) in the measured temperature range. The LBIC technique can be utilized effectively in the measurement of photoresponse uniformity of InGaAs infrared detectors, especially for the InGaAs subpixels detectors.
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