Real-time Gamma Irradiation Effects on Long-Wavelength InAs/GaSb Type II Superlattice Infrared Detector
Jin Chuan,Xu Jia-Jia,Huang Ai-Bo,Xu Zhi-Cheng,Zhou Yi,Bai Zhi-Zhong,Wang Fang-Fang,Chen Jian-Xin,Chen Hong-Lei,Ding Rui-Jun,He Li
DOI: https://doi.org/10.11972/j.issn.1001-9014.2017.06.009
2017-01-01
JOURNAL OF INFRARED AND MILLIMETER WAVES
Abstract:In this paper, the gamma-irradiation effect on InAs / GaSb II superlattice long-wave detectors was studied. The detector has a good anti-radiation performance under the irradiation of Co-60 gamma-rays as the current-voltage (I-V) characteristics of the devices did not change significantly with the increase of the irradiation dose. Compared with the value before irradiation, the reduction rate of the zero-bias resistance was only 3.4% under the irradiation dose of 100 krad ( Si). By combining the real-time I-V curves at different irradiation doses and the evolution of the current with time after the irradiation, the damage and the corresponding mechanism of the gamma-irradiation were analyzed. At zero bias as well as small reverse bias, the current is obviously increased after irradiation. The radiation damage is dominated by the transient ionization effect, and the device performance can be recovered in a short time. While at large reverse bias, the main dark current mechanism is the direct tunneling current, leading to a decreased dark current with the increase of the irradiation dose. The time of the damage recovery is significantly longer than that of the ionization damage, and an annealing may be required.