Design of Test System for Memory Module

Yang Sheng,Gao Deyuan,Yang Lijun,Yu Yun
DOI: https://doi.org/10.16526/j.cnki.11-4762/tp.2012.01.051
2012-01-01
Abstract:Bus-structured memory modules integrate many kinds of memories,the entire model provide a bus interface.Testing memory modules for all possible failure is essential to a computer system,This paper analyzed the structure of the memory modules carefully,provided a test device for memory modules based on digital waveform generator.Furthermore,this paper extended the March algorithm and proposed a suitable algorithm for testing the memory modules.The system enhanced the fault coverage and the test efficiency,it did well in practical application.
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