A Small Liquid-Nitrogen Cryostat for Studying the Optical-Electrical Properties of Thin Films

LI Jian-chang,LI Hong-yu,BA De-chun
DOI: https://doi.org/10.3969/j.issn.1002-0322.2012.02.014
2012-01-01
Abstract:This paper presents a simple liquid-nitrogen cryostat for studying the optical-electrical properties of thin films at variable low temperature(90K ~300K) under high vacuum conditions.It provides a stable and insulated low temperature condition,which can be widely used in the fields of optical,thermo-magnetic and superconductic materials.The sample can be maintained at any required temperature through a combination of a liquid-nitrogen Dewar apparatus and a heating unit.To measure the sample's photoelectrical properties,current-voltage characteristics of the samples can be studied under specific light illumination through an optical window on the cryostat.The heat load calculation indicates that the system can guarantee the desired low temperature environment long enough for studying the sample and it has advantages of simple structure,small space and stable temperature.It is suitable for the investigation of the optical-electrical properties of thin films and devices under variable low temperatures.
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