Optical Transition of Chalcogenide Phase-Change Thin Films

HB Yao,LP Shi,TC Chong,PK Tan,XS Miao
DOI: https://doi.org/10.1143/jjap.42.828
IF: 1.5
2003-01-01
Japanese Journal of Applied Physics
Abstract:The optical transitions of as-deposited and thermally annealed chalcogenide phase-change thin films were studied. Allowed indirect transition occurs in Ge, GeTe, and Ge2Sb2.3Te5 and allowed direct transition in Sb, Sb2Te3, Ge1Sb1Te2, Ge1Sb2Te4, Ge1Sb4Te7, and Ge2Sb2Te5. For both amorphous and crystalline states, optical energy gap Egopt decreases with increasing film thickness due to the blue shift effect. Egopt of crystalline is ∼0.5 eV lower than their amorphous counterparts. Egopt has a linear proportional relationship with the percentage of partial crystalline phases Rpc. The different kinds of optical transition and the decrease of Egopt between Ge2Sb2Te5 and Ge2Sb2.3Te5 may be attributed to the structural change, caused by the presence of the additional Sb as a structure modifier, which changes the interaction among the components of the Ge2Sb2Te5 system.
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