Preparation and conducting performance of LaNiO3/Ag film and its interface reaction

W YAO,H YANG,Y CHANG,Y ZHU
DOI: https://doi.org/10.1016/j.apsusc.2005.08.099
IF: 6.7
2006-01-01
Applied Surface Science
Abstract:LaNiO3 thin film with perovskite structure was successfully prepared on Ag substrate via an amorphous heteronuclear complex LaNi(DTPA)·6H2O as a precursor. The influences of precursor concentration and PEG additive with different molecular weight on the texture of the film were carefully studied. The interface states of LaNiO3/Ag film were revealed by using AES analysis. The effect of annealing time on the interface diffusion of the LaNiO3/Ag film was shown by using AES depth profile spectrum. The relationship between the electric resistivity of the film and the environmental temperature was measured by using four-probe method. The results showed the film had good metallic conductivity from 300 down to 77K.
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