Microstructural Characterization For Ge Clusters Embedded In A-Sin(Y) Matrix Prepared By Pecvd Method

Xuexuan Qu,Kunji Chen,Mingxiang Wang,Zhifeng Li,Hua Xia,Duan Feng
DOI: https://doi.org/10.1088/0256-307X/11/4/017
1994-01-01
Chinese Physics Letters
Abstract:We report the successful synthesis of Ge clusters embedded in a-SiN(y):H matrix prepared by the plasma enhanced chemical vapor deposition (PECVD) method. Chemical microstructural characteristics of this granular thin film were analysed using the infrared absorption, x-ray diffraction, Raman scattering, and transmission electron microscopy. Finally we discuss briefly the synthesis mechanism of this new material.
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