Preparation and Characterization of Visible Camouflage Films With Low Infrared Emissivity

Wang Cong,Diao Xungang,Cao Ye
DOI: https://doi.org/10.3969/j.issn.1007-2330.2010.06.014
2010-01-01
Abstract:The TiO2/TiN films were grown by multi-arc plasma deposition on Al substrates.Through controlling the roughness of the substrate material,the prepared films possessed non-specular reflection effect in visible band.The films were analyzed and characterized by scanning electron microscopy,infrared radiation measurement instrument and the UV-visible spectrum.The results show that visible camouflage films with low infrared emission and good binding force can be grown by multi-arc plasma deposition on Al substrate.The results show also that the infrared emission tends to be stabilized at a value of about 0.2,as the thickness of the oxide-layer increased.
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