Study of γ / γ ′ Interfaces in Nickel-Based, Single-Crystal Superalloys by Scanning Transmission Electron Microscopy

Binghui Ge,Yushi Luo,Jiarong Li,Jing Zhu
DOI: https://doi.org/10.1007/s11661-010-0566-y
2010-01-01
Metallurgical and Materials Transactions A
Abstract:The interfaces of γ / γ ′ in crept Re-bearing, single-crystal, nickel-based superalloys have been studied by scanning transmission electron microscopy. Elements Ni and Ta are congregated at the γ ′ side, ahead of the Re enrichment near interfaces, which shows the retarding effect on element diffusion during creep by Re enrichment. A growth step exists at the γ / γ ′ interfaces with the apex of kinks congregated with heavy atoms, which may slow down interface displacement during creep.
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