Study Of Gamma/Gamma' Interfaces In Nickel-Based, Single-Crystal Superalloys By Scanning Transmission Electron Microscopy

Binghui Ge,Yushi Luo,Jiarong Li,Jing Zhu
DOI: https://doi.org/10.1007/s11661-010-0566-y
2011-01-01
Abstract:The interfaces of gamma/gamma' in crept Re-bearing, single-crystal, nickel-based superalloys have been studied by scanning transmission electron microscopy. Elements Ni and Ta are congregated at the gamma' side, ahead of the Re enrichment near interfaces, which shows the retarding effect on element diffusion during creep by Re enrichment. A growth step exists at the gamma/gamma' interfaces with the apex of kinks congregated with heavy atoms, which may slow down interface displacement during creep.
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