YBCO Films Buffered by Pyrochlore Nd2Mo2O7 Layer on YSZ Substrates by Chemical Solution Deposition

Weibo Yang,Guofang Zhang,Lihua Jin,Chengshan Li,Guo Yan,Yafeng Lu

DOI: https://doi.org/10.1016/j.physc.2008.12.001

2009-01-01

Abstract:A chemical solution deposition process was used to grow epitaxial Nd2Mo2O7 (NMO) buffer layers on YSZ substrates to produce YBa2Cu3O7−δ (YBCO) coated conductors. The NMO precursor solution prepared using metal acetylacetonates was spin-coated onto single crystal YSZ substrate of 10 mm × 10 mm in size at 3000 rpm for 30 s and heat-treated at 1000 °C for 2 h in Ar after calcinated at 550 °C for 1 h. The YBCO film was deposited by TFA-MOD route on top of the NMO/YSZ architecture. The phase purity and the crystalline orientation of NMO and YBCO films were evaluated by X-ray diffraction (XRD). Scanning electron microscopy (SEM) and atomic force microscopy (AFM) were used to observe their microstructure and their surface roughness. The critical current density (Jc) of YBCO film on NMO/YSZ is 1.8 MA/cm2 at 77 K in self-field, which indicates that the Nd2Mo2O7 is a potential buffer for YBCO coated conductor.