STM Observation of Damage on HOPG Induced by Energetic Ions Escaped from Thick Botanic Samples

F Liu,YG Wang,JM Xue,SX Wang,S Yan,WJ Zhao
DOI: https://doi.org/10.1016/s0375-9601(01)00251-1
IF: 2.707
2001-01-01
Physics Letters A
Abstract:The target samples of 30-100 mum thick slices of kidney bean dry seeds and 8 and 72 mum ethylene terephthalate (PET) films were irradiated by 40 keV N+ ion beam. The current density was 8 muA/cm(2) and the fluency was in the range of 0.3-3 x 10(17) ions/cm(2). During ion irradiation, highly oriented pyrolytic graphite (HOPG) samples were placed behind the target samples to receive energetic ions. After irradiation, through scanning tunneling microscope (STM) observation, statistic number density of protrusion-like damage on HOPG surfaces have been obtained. The experimental results show that for 30 and 50 mum thick botanic slice samples, the number densities are 1.0-5.0 x 10(11) and 0.6-2 x 10(10)/cm(2), respectively. It demonstrates that 40 keV N+ ion irradiation can cause evident damage at a depth of 50 mum in dry kidney bean seed slices. Before and after low-energy ion irradiation, transmission spectra of MeV proton with low fluency rate were applied to examine those botanic samples and study the possible escaping mechanism of the energetic ions from them in the low-energy ion irradiation. (C) 2001 Elsevier Science B.V. All rights reserved.
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