Study on Nano-meter Scale Observation of Latent Tracks Induced by Ions

翟鹏济,唐孝威
DOI: https://doi.org/10.3969/j.issn.1000-6931.2002.06.020
2002-01-01
Abstract:Study on nano-meter scale observation of latent tracks induced by ions are discussed using scanning tunneling microscopy(STM) and scanning force microscopy(SFM). The topography and range of damaged area on the surface of material bombarded by ions and the correlation between damaged number density and ion dose are given. The relationship between diameter of the latent track and energy loss, and the various possible mechanism of damage process are discussed.
What problem does this paper attempt to address?