Abstract:Here a new microscopic method is proposed to image and characterize very thin samples like few-layer materials, organic molecules, and nanostructures with nanometer or sub-nanometer resolution using electron beams of energies lower than 20 eV. The microscopic technique achieves high resolution through the proximity (or near-field) effect, as in scanning tunneling microscopy (STM), while it also allows detection of transmitted electrons for imaging and spectroscopy, as in scanning transmission electron microscopy (STEM). This proximity transmission electron microscopy (PSTEM) does not require any lens to focus the electron beam. It also allows detailed characterization of the interaction of low-energy electron with materials. PSTEM can operate in a way very similar to scanning tunneling microscopy, which provides high-resolution imaging of geometric and electronic structures of the sample surface. In addition, it allows imaging and characterization of the interior structures of the sample based on the detected transmission electron signals. PSTEM comprises a family of spectroscopies that address the transport and scattering of low-energy electrons in materials. Thus rich information can be extracted from the measurements. PSTEM offers a fundamentally new and powerful way to investigate thin materials. New analysis methods of thin materials and new physics may be uncovered by this method.

Transmission Measurement Based on Stm Observation to Detect the Penetration Depth of Low-Energy Heavy Ions in Botanic Samples

A New Detection Method in Studying Penetration Depth of Low－energy Heavy Ions in Botanic Samples

The Study of Penetration of Energetic Ions in Botanic Samples with Transmission Measurements

Study of the Penetration Behavior of Energetic Ions in Botanic Materials with Transmission Measurement

Mechanism of Long-Range Penetration of Low-Energy Ions in Botanic Samples

STM Observation of Damage on HOPG Induced by Energetic Ions Escaped from Thick Botanic Samples

The primary target model of energetic ions penetration in thin botanic samples

STUDIES ON THE LONG- RANGE PENETRATION BEHAVIOR OF LOW- ENERGY IONS IN BOTANIC SAMPLES

STM-HOPG Counter for Low-Energy Heavy Particles: Principle and Application

Special Way of Increasing Linear Energy Transfer Value Used for Study on Single Event Effect

Studies on Surface Damage Induced by Ion Bombardment

Study on Nano-meter Scale Observation of Latent Tracks Induced by Ions

Quantification of Plasmodesmata Frequency under Three-Dimensional View Using Focused Ion Beam-Scanning Electron Microscopy and Image Analysis.

Positron Annihilation Study on Surface Structure of Biological Samples Implanted by Ions with Low Energy

Identification of Heavy Ions by Imaging Individual Particle Tracks in CF4-filled Gas Scintillation Detectors

HEAVY-ION BACKSCATTERING——A NEW METHOD FOR DETERMINATION OF TRACE HEAVY ELEMENTS ON THE SURFACE AND NEAR SURFACE

In Situ Pulsed Hydrogen Implantation in Atom Probe Tomography

Proximity Scanning Transmission Electron Microscopy/Spectroscopy

Estimating the Depth of Embedded Contaminants from In-Situ Gamma Spectroscopic Measurements

Energy Loss and Straggling of MeV Energy Ions Through Biological Samples

A High Resolution Spatial-temporal Imaging Diagnostic for High Energy Density Physics Experiments