High Frequency Performance of Nano-Scale Ultra-Thin-body Schottky-barrier N-Mosfets

Gang Du,XiaoYan Liu,RuQi Han
DOI: https://doi.org/10.1007/s11432-011-4267-y
2011-01-01
Science China Information Sciences
Abstract:The high frequency performances of nano-scale ultra-thin-body (UTB) Schottky-barrier n-MOSFETs (SB-nMOSFETs) are investigated using 2D full-band self-consistent ensemble Monte Carlo method. The UTB SB-nMOSFET devices offer excellent RF performance with high values of f T and f max. The significant dependence of f T and f max on gate voltage and weak dependence on barrier height are demonstrated. Meanwhile, the significant dependence of g m and g ds on both gate voltage and SB height are shown. Moreover, the scalability of f T is outstanding and close to the ideal case (f T ∝ 1/L g 2 ). The high frequency performances of 45 nm channel length SB-nMOSFETs at ballistic transport limit are also investigated. Results show that scattering strongly affects the capacitances C gs, C gd and C ds. At ballistic transport limit the f T and f max are almost 10 times larger. The Scattering effects in nano-scale SB-nMOSFETs cannot be neglected.
What problem does this paper attempt to address?