Parallel Technique Analysis for Effective Reducing Test Cost

Wang Min,Zhang Hong,Yan Peng
DOI: https://doi.org/10.3969/j.issn.1672-9722.2010.09.004
2010-01-01
Abstract:Through a quantitive analysis,this paper points out that parallel test not only reduces the system investment for ATE,but also costs down those crucial factors in the every test procedure.Compared with Low-cost ATE,parallel test provides more significant and more effective way to reduce test cost.In addition,ATE cost、operation cost、yield and other relative factors have no influence on the best number of sites in parallel test.While,with the limit of independent resources,the multi-site efficiency will decline,leading to apply sequential test in certain parts,which means to advantage of parallel test in cost soon disappeared.
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