Dynamic basic block-based test suite reduction

Ma Qian,Chen Lin,Lu Hongmin,Ding Hui
DOI: https://doi.org/10.3969/j.issn.2095-2783.2012.01.006
2012-01-01
Abstract:Fault-localization techniques that utilize dynamic coverage information to calculate suspiciousness for each statement in programs can effectively reduce developers’ effort.However,to inspect the results for large number of test inputs is very difficult and time-consuming,so test suite reduction becomes necessary.Traditional reduction techniques mostly use statements coverage criterion,but we proposed a different coverage criterion-dynamic block coverage and two dynamic basic block-based strategies to reduce the size of test inputs.Experiments prove that our approach can effectively reduce test inputs,and the fault-localization effectiveness after reduction almost not decline.
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