Dynamic hysteresis stability of ferroelectric Pb(Zr0.52Ti0.48)O3 thin films

J.-M Liu,Q Xiao,Z.G Liu,H.L.W Chan,N.B Ming
DOI: https://doi.org/10.1016/S0254-0584(03)00360-2
IF: 4.778
2003-01-01
Materials Chemistry and Physics
Abstract:Ferroelectric Pb(Zr0.52Ti0.48)O3 (PZT) thin films sandwiched by YBa2Cu3O7 (YBCO) electrodes on (001) SrTiO3 wafers are prepared by pulsed laser deposition. The dynamic hysteresis response of the films to the periodic time-varying electrical field E(t) of different amplitude E0 (0–45kVcm−1) and frequency f (f=10−2 to 105Hz) is measured. We study in detail the evolution and stability of the hysteresis pattern. A stability diagram for the dynamic hysteresis of PZT films is developed and an empirical scaling relationship covering the whole frequency range is proposed. Finally, we develop a Monte-Carlo (MC) algorithm based on the planar X–Y model to simulate the dynamic hysteresis in multi-domain spin systems and a qualitative consistency between the simulated dynamic behaviors and measured ones is established.
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