Temperature Dependence of Dynamic Hysteresis Behavior in Pb0.4sr0.6tio3 Ferroelectric Films

Kui Li,Tao Li,Gang Du,Denis Remiens,Xianlin Dong,Genshui Wang
DOI: https://doi.org/10.1016/j.ssc.2014.05.007
IF: 1.934
2014-01-01
Solid State Communications
Abstract:The temperature (T) dependence of dynamic hysteresis behavior is investigated in low temperature crystallized Pb0.4Sr0.6TiO3 thin films between 85 K and 340 K. It was found that the temperature scaling relations for hysteresis area 'A'. remnant polarization P-r and coercive field E-c Lake the different forms in two different temperature regions divided by a transition region ranging from 190 K to 225 K and the 'A', P-r and E-c decreased in the first region and increased in the second region with increasing T. The different scaling relations can be predicted by the effect of thermal activated de-freezing of domain wall and dielectric response of defects with applied electric field. Moreover, the effect of substrate temperature on the dynamic hysteresis behavior versus T is also investigated. (C) 2014 Elsevier Ltd. All rights reserved,
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