Frequency Response and Scaling of Hysteresis for Ferroelectric Pr(Zr0.52Ti0.48)O3 Thin Films Deposited by Laser Ablation

JM Liu,HP Li,CK Ong,LC Lim
DOI: https://doi.org/10.1063/1.371500
IF: 2.877
1999-01-01
Journal of Applied Physics
Abstract:The ferroelectric hysteresis response against periodically varying electric field over frequency range of 10−2–105 Hz and amplitude range of 2–45 kV/cm for YBa2Cu3O7 (YBCO)/ Pb(Ti0.48Zr0.52)O3 (PZT)/YBCO thin film capacitors prepared by laser ablation is measured by utilizing the Sawyer–Tower circuit. Given amplitude Δ of the field, the hysteresis area 〈A〉 first grows and then decays as a function of frequency φ. At low and high ranges of frequency, 〈A〉 can be scaled as 〈A〉∝φ1/3Δ2/3 and 〈A〉∝φ−1/3Δ, respectively. It is established that the dynamic hysteresis at the high frequency range for a PZT thin film capacitor does not follow the theoretically predicted scaling law. An empirical scaling law 〈A〉∝φ1/3(Δ−Δ0)2/3/(1+bφ2/3Δ−1/3) with Δ0 the critical field and b a constant, is proposed to characterize the frequency and amplitude dependence of the hysteresis area over all the frequency range. In addition, the remnant polarization Pr and coercive field Ec as functions of φ are investigated, respectively, revealing a single-peaked pattern of both Pr and Ec.
What problem does this paper attempt to address?