Design of Thin Film Magnetostrictive Coefficient Computer Assistant Measuring System

Jiang Hongchuan,Zhang Wenxu,Zhang Wanli
DOI: https://doi.org/10.13382/j.jemi.2005.03.014
2005-01-01
JOURNAL OF ELECTRONIC MEASUREMENT AND INSTRUMENT
Abstract:In this paper, the method of laser cantilever magnification was used for the measuring of the thin film magnetostrictive coefficient. The displacement of laser beam was detected by the Position Sensitive Detector(PSD). Through A/D transition, the data were collected by EPP port of the computer. Then the visual interface based on Windows platform was written in C~ ++ language. The cantilever micro-deflection measurement was designed and realized. The visual computer assistant measuring system of thin film magnetostrictive coefficient is realized successfully.
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