SrBi4Ti4O15 Thin Films and Their Ferroelectric Fatigue Behaviors under Varying Switching Pulse Widths and Frequencies
ST Zhang,B Yang,YF Chen,ZG Liu,XB Yin,Y Wang,M Wang,NB Ming
DOI: https://doi.org/10.1063/1.1435414
IF: 2.877
2002-01-01
Journal of Applied Physics
Abstract:Polycrystalline ferroelectric SrBi4Ti4O15 thin films were prepared on Pt-coated silicon substrates by pulsed laser deposition. Structures of the films were analyzed by x-ray diffraction, atomic force microscopy (AFM) and scanning electron microscopy. At an applied field of 275 kV/cm, the films showed good hysteresis loops with remnant polarization (Pr), saturated polarization (Ps) and coercive field (Ec) of 3.11 μC/cm2, 7.81 μC/cm2 and 68 kV/cm, respectively. At 120 kV/cm switching pulse field, fatigue tests were carried out systematically by varying the switching pulsewidth with a fixed duty cycle and with a fixed switching period, respectively. A gradual increase followed by an abrupt increase of the fatigue rate was observed with the increase of the switching pulsewidth. Field-induced defect diffusion was used to explain the results.