Visualization of carrier depletion in semiconducting nanowires.

Oliver Hayden,Gengfeng Zheng,Prabhat Agarwal,Charles M Lieber
DOI: https://doi.org/10.1002/smll.200700600
IF: 13.3
2007-01-01
Small
Abstract:The visualization of the space–charge region in nanowire pn junctions (see image) is presented by far-field optical microscopy. This general approach is a powerful tool for estimates of the carrier distributions and device capacitances. For the case of an n-CdS/p+-Si heterojunction we show that the carrier depletion widths in nanowires deviate from the traditional square-root dependence purely due to electrostatic effects.
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